太赫兹光学厚度和双折射测量,用于热障涂层缺陷定位,Optics Express |
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Terahertz optical thickness and birefringence measurement for thermal barrier coating defect location
We present a normal incidence terahertz reflectivity technique to determine the optical thickness and birefringence of yttria-stabilized zirconia (YSZ) thermal barrier coatings (TBCs). Initial verification of the method was achieved by measurement of a set of fused silica calibration samples with known thicknesses and showed excellent agreement ( |
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