太赫兹光学厚度和双折射测量,用于热障涂层缺陷定位,Optics Express

您所在的位置:网站首页 太赫兹厚度测量 太赫兹光学厚度和双折射测量,用于热障涂层缺陷定位,Optics Express

太赫兹光学厚度和双折射测量,用于热障涂层缺陷定位,Optics Express

#太赫兹光学厚度和双折射测量,用于热障涂层缺陷定位,Optics Express| 来源: 网络整理| 查看: 265

Terahertz optical thickness and birefringence measurement for thermal barrier coating defect location

We present a normal incidence terahertz reflectivity technique to determine the optical thickness and birefringence of yttria-stabilized zirconia (YSZ) thermal barrier coatings (TBCs). Initial verification of the method was achieved by measurement of a set of fused silica calibration samples with known thicknesses and showed excellent agreement (



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