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光学学报, 2018, 38 (2): 0223001, 网络出版: 2018-08-30 光电产品的新型寿命预测模型及其应用 下载： 909次A Novel Model of Life Prediction for Photoelectric Products and Its ApplicationGet PDFFull Text图表MetricsMore 张建平 1,*宗雨 1朱文清 2易勐 3
作者单位 1 上海电力学院能源与机械工程学院, 上海 2000902 上海大学新型显示技术及应用集成教育部重点实验室, 上海 2000723 浙江易鑫电子科技有限公司, 浙江 金华 321200
光学器件 寿命预测模型 加速退化实验 威布尔函数 Power函数 optical devices life prediction model accelerated degradation tests Weibull function Power function AI词云图 AI语音精读 AI语音超短摘要【AI生成本文一句话精读】：【AI生成本文短摘要】：注：本部分内容由 AI 自动生成，仅供您参考。对于您使用本站 AI 自动生成内容所产生的一切后果，本网站及平台运营方概不承担任何商业和法律责任，请您知悉。 摘要大多数现有的寿命预测模型在处理光电产品实验数据时存在耗时长、精度低等问题。为了短时间内准确地预测光电产品的寿命,利用两参数威布尔函数拟合多组应力下的亮度衰减数据获得加速寿命,通过拟合优度检验参数确定Power函数来外推常规寿命,从而构建了一种新型的光电产品寿命预测模型:加速寿命外推模型(ALEM)。将该模型应用于真空荧光显示屏(VFD)寿命的快速预测,开展了4组恒定应力加速退化实验,实现了模型精度的评价。结果表明,设计的VFD加速退化实验方案正确可行,采集的实验数据客观地反映了VFD亮度衰减特性;ALEM准确地描述了加速应力下亮度的变化轨迹,很好地揭示了应力随寿命变化的规律,无需开展常规寿命实验便可精确地外推出产品的寿命,为现代光电产品的寿命评估开辟了一种新的方法和途径。 AbstractMost existing life prediction models for photoelectric products have many problems such as time consuming and low precision in processing test data. In order to accurately predict the life of optoelectronic products in a short time, two-parameter Weibull function is used to fit luminance degradation data under multigroup stresses to obtain accelerated life, and Power function determined by the parameters of goodness-of-fit test is employed to extrapolate conventional life. Thereby, a novel model of life prediction, named accelerated life extrapolation model (ALEM), is established. The model is applied to rapidly predict the life of vacuum fluorescent display (VFD), accelerated degradation tests under four groups of constant stresses are carried out, and then the evaluation of the model precision is achieved. The results show that VFD test design scheme is correct and feasible, and the collected test data objectively reflect the characteristics of VFD luminance degradation. The ALEM exactly describes the change trajectory of luminance under each accelerated stress, well reveals the variation law of stress with life, and precisely extrapolates the product life without conducing conventional life test. Which can open up a new method and approach for the life estimation of modern optoelectronic products. PDF全文 张建平, 宗雨, 朱文清, 易勐. 光电产品的新型寿命预测模型及其应用[J]. 光学学报, 2018, 38(2): 0223001. Jianping Zhang, Yu Zong, Wenqing Zhu, Meng Yi. A Novel Model of Life Prediction for Photoelectric Products and Its Application[J]. Acta Optica Sinica, 2018, 38(2): 0223001.
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