James Leger, Editor-in-Chief

Editorial Board | Staff

The Optical Society (OSA) publishes high-quality, peer-reviewed articles in its portfolio of journals, which serve the full breadth of the optics and photonics community.

Optics Express is the all-electronic, open-access journal for optics providing rapid publication for peer-reviewed articles that emphasize scientific and technology innovations in all aspects of optics and photonics.

Additionally, Optics Express publishes papers dedicated to new developments in the science and engineering of light and their impact on sustainable energy, the environment, and green technologies in its dedicated section, Energy and Environmental Optics Express. These papers are published online in each issue as they are ready.

For details about the scope of Optics Express with regards to digital image processing, see the editorial published in April 2014.

Optics Express considers original research articles, special issue contributions, invited reviews and comments on published articles.

Is my paper appropriate for Optics Express? Read about all OSA journals here.

Please see the Author Resource Center for instructions to prepare and submit a manuscript.

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Impact Factor: 3.561*Eigenfactor Score: 0.17335 (ranked 1st out of 95 journals)*Total Citations: 115,635 (ranked 2nd out of 95 journals)*Google Scholar h5-index: 99 (ranked 2nd among Optics & Photonics journals)†Median Time to Publication: 70 days

*According to Optics category rankings in the 2018 Journal Citation Reports® (Clarivate Analytics, 2019)†July 2019 Google Scholar Optics & Photonics Top Publications.

For more information on Journal metrics, click here.

James Leger, University of Minnesota, USA 

Chris Dainty, National University of Ireland (Ireland) and University College London, UK

Nicolas Bonod, CNRS, Aix-Marseille Université, FranceGlenn Boreman, University of North Carolina at Charlotte, USASvetlana Boriskina, Massachusetts Institute of Technology, USA (Energy and Environmental Optics Express)John Girkin, University of Durham, UKMagnus Karlsson, Chalmers University of Technology, SwedenXiang Liu, Futurewei Technologies, USAAlexander I. Lvovsky, University of Calgary, CanadaThomas E. Murphy, University of Maryland at College Park, USAMarija Strojnik, Optical Research Center, Mexico

Ayman Alfalou, ISEN-Brest, FranceChristos Argyropoulos, University of Nebraska Lincoln, USAPaul Barclay, University of Calgary, CanadaAndreas Behrendt, University of Hohenheim, GermanyPhilippe Ben-Abdallah, Institut d'Optique Graduate School, FrancePeter Bermel, Purdue University, USABenedikt Bläsi, Fraunhofer ISE, GermanyPablo Bianucci, Concordia University, CanadaPatrick Bouchon, CNRS-ONERA, FranceGerard Bouwmans, Lille I University, FranceChristophe Caucheteur, Universite de Mons, BelgiumGuoqing (Noah) Chang, Institute of Physics, Chinese Academy of Sciences, ChinaMaria Chekhova, Max Planck Institute for the Science of Light, GermanyYanne Chembo, University of Maryland, USAXi (Vivian) Chen, Nokia Bell Labs, USAYung-Fu Chen, National Chiao Tung University, TaiwanMyunghwan (Mark) Choi, Sungkyunkwan University, S. KoreaAndy Chong, University of Dayton, USAIan Coddington, National Institute of Standards & Technology, USAHilmi Volkan Demir, Nanyang Technological University LUMINOUS!, Singapore, and Bilkent University UNAM, TurkeyThibault Derrien, Institute of Physics (FZU), Academy of Science of the Czech Republic, Czech RepublicYajie Dong, University of Central Florida, USADavid Doxaran, Lab d'Océanographie de Villefranche—LOV, FranceYannick Dumeige, Université de Rennes I, FranceJonathan Ellis, University of Arizona, USAAndrew Forbes, University of the Witwatersrand, South AfricaMatthew Foreman, Imperial College London, UKAmy Foster, Johns Hopkins University, USASonja Franke-Arnold, University of Glasgow, UKJesse Frantz, US Naval Research Laboratory, USAGerald Fraser, National Institute of Standards and Technology (NIST), USAUlrike Fuchs, asphericon Gmbh, GermanyTakao Fuji, Institute for Molecular Science, JapanTakeshi Fujisawa, Hokkaido University, JapanVincenzo Galdi, University of Sannio, ItalyLukas Gallmann, ETH Zurich, SwitzerlandThomas Gerrits, National Institute of Standards & Technology, USAReuven Gordon, University of Victoria, CanadaFrédéric Grillot, Télécom ParisTech, FranceCharlotte Hagen, University College London, UKAmr Helmy, Univ. of Toronto, CanadaJavier Hernandez-Andres, University of Granada, SpainAnthony Hoffman, University of Notre Dame, USARyoichi Horisaki, Osaka University, JapanWeisheng Hu, Shanghai Jiao Tong University, ChinaYue-Kai Huang, NEC Laboratories America, Inc., USAOlindo Isabella, Delft University of Technology, The NetherlandsRavi Jain, University of New Mexico, USAEbrahim Karimi, University of Ottawa, CanadaMercedeh Khajavikhan, University of Central Florida, CREOL, USAHoon Kim, KAIST, South KoreaChristian Kränkel, University of Hamburg, GermanyFredrik Laurell, KTH, SwedenChanghui Li, Peking University, ChinaJensen Li, Hong Kong University of Science and Technology, Hong KongFan Li, Sun Yat-Sen University, ChinaMo Li, University of Washington, USAYan Li, Shanghai Jiao Tong University, ChinaHsing-Chih Liang, National Taiwan Ocean University, TaiwanYi-Hsin Lin, National Chiao Tung University, TaiwanNatalia Litchinitser, Duke University, USAShutian Liu, Harbin Institute of Technology, ChinaPenghui Ma, National Research Council Canada, CanadaPasquale Maddaloni, Istituto Nazionale di Ottica-Consiglio Nazionale delle Ricerche (INO-CNR), ItalyMangirdas Malinauskas, Vilnius University, LithuaniaAntonio Mecozzi, University of L'Aquila, ItalyArgishti Melikyan, Nokia—Bell Labs, USARajesh Menon, University of Utah, USAPaolo Minzioni, University of Pavia, ItalyJeffrey Moses, Cornell University, USAStuart Murdoch, University of Auckland, New ZealandPatrick P. Naulleau, Lawrence Berkeley National Laboratory, USAJohan Nilsson, University of Southampton, UKBoon Ooi, King Abdullah University of Science & Technology, Saudi ArabiaYongKeun (Paul) Park, KAIST, South KoreaMarco Peccianti, University of Sussex, UKNicholas Peters, Oak Ridge National Laboratory, USAJoyce Poon, University of Toronto, CanadaJie Qiao, Rochester Institute of Technology, USAFabien Quéré, CEA Iramis, FranceMahmoud Rasras, New York University Abu Dhabi, UAERonald Reano, Ohio State University, USAGordon Robb, University of Strathclyde, UKFabian Rotermund, KAIST, South KoreaSukesh Roy, Spectral Energies LLC, USA Jose Sanchez-Gil, Instituto de Estructura de la Materia, SpainClara Saraceno, Ruhr University Bochum, Germany Giuliano Scarcelli, University of Maryland, College Park, USAPaolo Serena, University of Parma, ItalyTero Setala, University of Eastern Finland, FinlandDavid Shealy, University of Alabama, Birmingham, USAYoav Shechtman, Technion, Israel Institute of Technology, IsraelJin-Wei Shi, National Central University, TaiwanKehar Singh, The NorthCap University Gurgaon, IndiaDavid Spence, Macquarie University, AustraliaBalaji Srinivasan, Indian Institute of Technology, Madras, IndiaIsabelle Staude, University of Jena, GermanyJim Sullivan, Florida Atlantic University, Harbor Branch Oceanographic Institute, USAXiankai Sun, Chinese University of Hong Kong, Hong KongV R Supradeepa, Indian Institute of Science, India Simon Thibault, University of Laval, CanadaVictor Torres-Company, Chalmers University of Technology, SwedenDmitry Turchinovich, Bielefeld University, GermanyQiong-Hua Wang, Sichuan University, ChinaGordon Wetzstein, Stanford University, USAMichael Withford, Macquarie University, AustraliaUlrich Wittrock, Münster University of Applied Sciences, GermanyKenneth Kin-Yip Wong, University of Hong Kong, Hong KongGerard Wysocki, Princeton University, USAQihua Xiong, Nanyang Technical University, SingaporeXianfan Xu, Purdue University, USAVladislav Yakovlev, Max Planck Institute of Quantum Optics, GermanyShinji Yamashita, University of Tokyo, JapanHo-Soon Yang, Korea Research Institute of Standards and Science, South KoreaJoel Yang, Singapore University of Technology and Design, SingaporeXiaodong Yang, Missouri University of Science and Technology, USAChang-Jae Yu, Hangyang University, South KoreaZeev Zalevsky, Bar-Ilan University, IsraelMichalis Zervas, University of Southampton, UKPengwang Zhai, University of Maryland Baltimore County, USANing Hua Zhu, Institute of Semiconductors, Chinese Academy of Sciences, ChinaZuqing Zhu, University of Science and Technology of China, ChinaQunbi Zhuge, Ciena Corp., Canada